Nanlin Guo, Fulin Peng, Jiahe Shi, Fan Yang 0001, Jun Tao 0001, Xuan Zeng 0001. Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation. ACM Trans. Design Autom. Electr. Syst., 29(1), January 2024. [doi]
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