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Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation

Nanlin Guo, Fulin Peng, Jiahe Shi, Fan Yang 0001, Jun Tao 0001, Xuan Zeng 0001. Yield Optimization for Analog Circuits over Multiple Corners via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation. ACM Trans. Design Autom. Electr. Syst., 29(1), January 2024. [doi]

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