Shaofeng Guo, Runsheng Wang, Zhuoqing Yu, Peng Hao, Pengpeng Ren, Yangyuan Wang, Siyu Liao, Chunyi Huang, Tianlei Guo, Alvin Chen, Jushan Xie, Ru Huang. Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator. In 2017 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2017, Irvine, CA, USA, November 13-16, 2017. pages 780-785, IEEE, 2017. [doi]
Abstract is missing.