Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code

Jing Guo, Liyi Xiao, Zhigang Mao, Qiang Zhao. Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code. IEEE Trans. VLSI Syst., 22(1):127-135, 2014. [doi]

Authors

Jing Guo

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Liyi Xiao

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Zhigang Mao

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Qiang Zhao

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