Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code

Jing Guo, Liyi Xiao, Zhigang Mao, Qiang Zhao. Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code. IEEE Trans. VLSI Syst., 22(1):127-135, 2014. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.