Jing Guo, Liyi Xiao, Zhigang Mao, Qiang Zhao. Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code. IEEE Trans. VLSI Syst., 22(1):127-135, 2014. [doi]
@article{GuoXMZ14,
title = {Enhanced Memory Reliability Against Multiple Cell Upsets Using Decimal Matrix Code},
author = {Jing Guo and Liyi Xiao and Zhigang Mao and Qiang Zhao},
year = {2014},
doi = {10.1109/TVLSI.2013.2238565},
url = {http://dx.doi.org/10.1109/TVLSI.2013.2238565},
researchr = {https://researchr.org/publication/GuoXMZ14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {22},
number = {1},
pages = {127-135},
}