Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Hu Guojun, Roberto Rossi, Jing-en Luan, Xavier Baraton. Interface delamination analysis of TQFP package during solder reflow. Microelectronics Reliability, 50(7):1014-1020, 2010. [doi]
Abstract is missing.