On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs

Sayak Dutta Gupta, Vipin Joshi, Rajarshi Roy Chaudhuri, Anant kr Singh, Sirsha Guha, Mayank Shrivastava. On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-4, IEEE, 2020. [doi]

Authors

Sayak Dutta Gupta

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Vipin Joshi

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Rajarshi Roy Chaudhuri

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Anant kr Singh

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Sirsha Guha

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Mayank Shrivastava

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