Sayak Dutta Gupta, Vipin Joshi, Rajarshi Roy Chaudhuri, Anant kr Singh, Sirsha Guha, Mayank Shrivastava. On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-4, IEEE, 2020. [doi]
@inproceedings{GuptaJCSGS20,
title = {On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs},
author = {Sayak Dutta Gupta and Vipin Joshi and Rajarshi Roy Chaudhuri and Anant kr Singh and Sirsha Guha and Mayank Shrivastava},
year = {2020},
doi = {10.1109/IRPS45951.2020.9128226},
url = {https://doi.org/10.1109/IRPS45951.2020.9128226},
researchr = {https://researchr.org/publication/GuptaJCSGS20},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}