Test pattern generation based on arithmetic operations - researchr publication authors

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Sanjay Gupta, Janusz Rajski, Jerzy Tyszer. Test pattern generation based on arithmetic operations. In Jochen A. G. Jess, Richard L. Rudell, editors, Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994, San Jose, California, USA, November 6-10, 1994. pages 117-124, IEEE Computer Society, 1994. [doi]

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