Sanjay Gupta, Janusz Rajski, Jerzy Tyszer. Test pattern generation based on arithmetic operations. In Jochen A. G. Jess, Richard L. Rudell, editors, Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994, San Jose, California, USA, November 6-10, 1994. pages 117-124, IEEE Computer Society, 1994. [doi]
@inproceedings{GuptaRT94, title = {Test pattern generation based on arithmetic operations}, author = {Sanjay Gupta and Janusz Rajski and Jerzy Tyszer}, year = {1994}, doi = {10.1145/191326.191374}, url = {http://doi.acm.org/10.1145/191326.191374}, tags = {rule-based, testing}, researchr = {https://researchr.org/publication/GuptaRT94}, cites = {0}, citedby = {0}, pages = {117-124}, booktitle = {Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994, San Jose, California, USA, November 6-10, 1994}, editor = {Jochen A. G. Jess and Richard L. Rudell}, publisher = {IEEE Computer Society}, isbn = {0-89791-690-5}, }