Automatic Test Generation for Combinational Threshold Logic Networks

Pallav Gupta, Rui Zhang, Niraj K. Jha. Automatic Test Generation for Combinational Threshold Logic Networks. IEEE Trans. VLSI Syst., 16(8):1035-1045, 2008. [doi]

Authors

Pallav Gupta

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Rui Zhang

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Niraj K. Jha

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