Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests

Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers. Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests. J. Electronic Testing, 19(2):195-205, 2003. [doi]

Authors

Said Hamdioui

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Zaid Al-Ars

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A. J. van de Goor

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Mike Rodgers

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