The following publications are possibly variants of this publication:
- Linked faults in random access memories: concept, fault models, test algorithms, and industrial resultsSaid Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers. tcad, 23(5):737-757, 2004. [doi]
- Testing Static and Dynamic Faults in Random Access MemoriesSaid Hamdioui, Zaid Al-Ars, A. J. van de Goor. vts 2002: 395-400 [doi]