Said Hamdioui, A. J. van de Goor, Mike Rodgers. Detecting Intra-Word Faults in Word-Oriented Memories. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 241-247, IEEE Computer Society, 2003. [doi]
Abstract is missing.