Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Said Hamdioui, A. J. van de Goor, Mike Rodgers. Detecting Intra-Word Faults in Word-Oriented Memories. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 241-247, IEEE Computer Society, 2003. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Evaluation of Intra-Word Faults in Word-Oriented RAMsSaid Hamdioui, John Delos Reyes, Zaid Al-Ars. ats 2004: 283-288 [doi] Minimal Test for Coupling Faults in Word-Oriented MemoriesA. J. van de Goor, Magdy S. Abadir, Alan Carlin. date 2002: 944-948 [doi] March Tests for Word-Oriented MemoriesA. J. van de Goor, Issam B. S. Tlili. date 1998: 501 [doi]
The following publications are possibly variants of this publication: