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Ilker Hamzaoglu, Janak H. Patel. Test set compaction algorithms for combinational circuits. In ICCAD. pages 283-289, 1998. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Test set compaction algorithms for combinational circuitsIlker Hamzaoglu, Janak H. Patel. tcad, 19(8):957-963, 2000. [doi] Compact two-pattern test set generation for combinational and full scan circuitsIlker Hamzaoglu, Janak H. Patel. itc 1998: 944-953 [doi]
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