Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies - researchr publication authors

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Licai Hao, Xinyi Zhang, Chenghu Dai, Qiang Zhao 0007, Wenjuan Lu, Chunyu Peng, Yongliang Zhou, Zhiting Lin, Xiulong Wu. Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies. IEEE Trans. VLSI Syst., 32(4):597-608, April 2024. [doi]

This author has not been identified. Look up 'Licai Hao' in GoogleThis author has not been identified. Look up 'Xinyi Zhang' in GoogleThis author has not been identified. Look up 'Chenghu Dai' in GoogleThis author has not been identified. Look up 'Qiang Zhao 0007' in GoogleThis author has not been identified. Look up 'Wenjuan Lu' in GoogleThis author has not been identified. Look up 'Chunyu Peng' in GoogleThis author has not been identified. Look up 'Yongliang Zhou' in GoogleThis author has not been identified. Look up 'Zhiting Lin' in GoogleThis author has not been identified. Look up 'Xiulong Wu' in Google

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