Licai Hao, Xinyi Zhang, Chenghu Dai, Qiang Zhao 0007, Wenjuan Lu, Chunyu Peng, Yongliang Zhou, Zhiting Lin, Xiulong Wu. Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies. IEEE Trans. VLSI Syst., 32(4):597-608, April 2024. [doi]
Abstract is missing.