Licai Hao, Xinyi Zhang, Chenghu Dai, Qiang Zhao 0007, Wenjuan Lu, Chunyu Peng, Yongliang Zhou, Zhiting Lin, Xiulong Wu. Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies. IEEE Trans. VLSI Syst., 32(4):597-608, April 2024. [doi]
@article{HaoZDZLPZLW24,
title = {Soft-Error-Immune Quadruple-Node-Upset Tolerant Latch Based on Polarity Design and Source-Isolation Technologies},
author = {Licai Hao and Xinyi Zhang and Chenghu Dai and Qiang Zhao 0007 and Wenjuan Lu and Chunyu Peng and Yongliang Zhou and Zhiting Lin and Xiulong Wu},
year = {2024},
month = {April},
doi = {10.1109/TVLSI.2023.3342982},
url = {https://doi.org/10.1109/TVLSI.2023.3342982},
researchr = {https://researchr.org/publication/HaoZDZLPZLW24},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {32},
number = {4},
pages = {597-608},
}