BIST-based delay path testing in FPGA architectures

Ian G. Harris, Premachandran R. Menon, Russell Tessier. BIST-based delay path testing in FPGA architectures. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 932-938, IEEE Computer Society, 2001.

Abstract

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