CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application - researchr publication authors

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Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada. CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 117-122, IEEE Computer Society, 2001. [doi]

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