The following publications are possibly variants of this publication:
- CMOS open defect detection by supply current testMasaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada. date 2001: 509 [doi]
- Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric FieldHiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada. dft 2001: 287 [doi]
- CMOS Open Fault Detection by Appearance Time of Switching Supply CurrentMasaki Hashizume, Tetsuo Akita, Hiroyuki Yotsuyanagi, Takeomi Tamesada. delta 2004: 183-188 [doi]
- Electric field for detecting open leads in CMOS logic circuits by supply current testingMasaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada. iscas 2005: 2995-2998 [doi]
- Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric FieldHiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada. delta 2002: 387-391 [doi]