Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada. CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 117-122, IEEE Computer Society, 2001. [doi]
@inproceedings{HashizumeIYT01,
title = {CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application},
author = {Masaki Hashizume and Masahiro Ichimiya and Hiroyuki Yotsuyanagi and Takeomi Tamesada},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/ats/2001/1378/00/13780117abs.htm},
tags = {rule-based, source-to-source, open-source},
researchr = {https://researchr.org/publication/HashizumeIYT01},
cites = {0},
citedby = {0},
pages = {117-122},
booktitle = {10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan},
publisher = {IEEE Computer Society},
isbn = {0-7695-1378-6},
}