A monitoring circuit for NBTI degradation at 65nm technology node - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

YanDong He, Jie Hong, Ganggang Zhang, Lin Han, Xing Zhang. A monitoring circuit for NBTI degradation at 65nm technology node. In 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013. pages 2083-2086, IEEE, 2013. [doi]

This author has not been identified. Look up 'YanDong He' in GoogleThis author has not been identified. Look up 'Jie Hong' in GoogleThis author has not been identified. Look up 'Ganggang Zhang' in GoogleThis author has not been identified. Look up 'Lin Han' in GoogleThis author has not been identified. Look up 'Xing Zhang' in Google

runs on WebDSL