YanDong He, Jie Hong, Ganggang Zhang, Lin Han, Xing Zhang. A monitoring circuit for NBTI degradation at 65nm technology node. In 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013. pages 2083-2086, IEEE, 2013. [doi]
@inproceedings{HeHZHZ13,
title = {A monitoring circuit for NBTI degradation at 65nm technology node},
author = {YanDong He and Jie Hong and Ganggang Zhang and Lin Han and Xing Zhang},
year = {2013},
doi = {10.1109/ISCAS.2013.6572284},
url = {http://dx.doi.org/10.1109/ISCAS.2013.6572284},
researchr = {https://researchr.org/publication/HeHZHZ13},
cites = {0},
citedby = {0},
pages = {2083-2086},
booktitle = {2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013},
publisher = {IEEE},
isbn = {978-1-4673-5760-9},
}