A monitoring circuit for NBTI degradation at 65nm technology node - researchr publication bibliographies

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YanDong He, Jie Hong, Ganggang Zhang, Lin Han, Xing Zhang. A monitoring circuit for NBTI degradation at 65nm technology node. In 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), Beijing, China, May 19-23, 2013. pages 2083-2086, IEEE, 2013. [doi]

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