Stephan Henzler, Philip Teichmann, Markus Koban, Jörg Berthold, Georg Georgakos, Doris Schmitt-Landsiedel. Impact of Gate Leakage on Efficiency of Circuit Block Switch-Off Schemes. In Manfred Glesner, Ricardo Augusto da Luz Reis, Leandro Soares Indrusiak, Vincent John Mooney III, Hans Eveking, editors, VLSI-SOC: From Systems to Chips - IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003), December 1-3, 2003, Darmstadt, Germany. Volume 200 of IFIP, pages 229-245, Springer, 2003. [doi]
Abstract is missing.