Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Shohei Hido, Shoko Suzuki, Risa Nishiyama, Takashi Imamichi, Rikiya Takahashi, Tetsuya Nasukawa, Tsuyoshi Idé, Yusuke Kanehira, Rinju Yohda, Takeshi Ueno, Akira Tajima, Toshiya Watanabe. Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining. JIP, 20(3):655-666, 2012. [doi]

This author has not been identified. Look up 'Shohei Hido' in GoogleThis author has not been identified. Look up 'Shoko Suzuki' in GoogleThis author has not been identified. Look up 'Risa Nishiyama' in GoogleThis author has not been identified. Look up 'Takashi Imamichi' in GoogleThis author has not been identified. Look up 'Rikiya Takahashi' in GoogleThis author has not been identified. Look up 'Tetsuya Nasukawa' in GoogleThis author has not been identified. Look up 'Tsuyoshi Idé' in GoogleThis author has not been identified. Look up 'Yusuke Kanehira' in GoogleThis author has not been identified. Look up 'Rinju Yohda' in GoogleThis author has not been identified. Look up 'Takeshi Ueno' in GoogleThis author has not been identified. Look up 'Akira Tajima' in GoogleThis author has not been identified. Look up 'Toshiya Watanabe' in Google

runs on WebDSL