Shohei Hido, Shoko Suzuki, Risa Nishiyama, Takashi Imamichi, Rikiya Takahashi, Tetsuya Nasukawa, Tsuyoshi Idé, Yusuke Kanehira, Rinju Yohda, Takeshi Ueno, Akira Tajima, Toshiya Watanabe. Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining. JIP, 20(3):655-666, 2012. [doi]
@article{HidoSNITNIKYUTW12,
title = {Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining},
author = {Shohei Hido and Shoko Suzuki and Risa Nishiyama and Takashi Imamichi and Rikiya Takahashi and Tetsuya Nasukawa and Tsuyoshi Idé and Yusuke Kanehira and Rinju Yohda and Takeshi Ueno and Akira Tajima and Toshiya Watanabe},
year = {2012},
doi = {10.2197/ipsjjip.20.655},
url = {http://dx.doi.org/10.2197/ipsjjip.20.655},
researchr = {https://researchr.org/publication/HidoSNITNIKYUTW12},
cites = {0},
citedby = {0},
journal = {JIP},
volume = {20},
number = {3},
pages = {655-666},
}