Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita. Test sequence compaction by reduced scan shift and retiming. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 169-175, IEEE Computer Society, 1995. [doi]
@inproceedings{HigamiKK95:0,
title = {Test sequence compaction by reduced scan shift and retiming},
author = {Yoshinobu Higami and Seiji Kajihara and Kozo Kinoshita},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/ats/1995/7129/00/71290169abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HigamiKK95%3A0},
cites = {0},
citedby = {0},
pages = {169-175},
booktitle = {4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India},
publisher = {IEEE Computer Society},
isbn = {0-8186-7129-7},
}