Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita. Test sequence compaction by reduced scan shift and retiming. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 169-175, IEEE Computer Society, 1995. [doi]
No references recorded for this publication.
No citations of this publication recorded.