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Yoshinobu Higami, Seiji Kajihara, Kozo Kinoshita. Test sequence compaction by reduced scan shift and retiming. In 4th Asian Test Symposium (ATS 95), November 23-24, 1995. Bangalore, India. pages 169-175, IEEE Computer Society, 1995. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Partial scan design and test sequence generation based on reduced scan shift methodYoshinobu Higami, Seiji Kajihara, Kozo Kinoshita. et, 7(1-2):115-124, 1995. [doi] Reduced Scan Shift: A New Testing Method for Sequential CircuitYoshinobu Higami, Seiji Kajihara, Kozo Kinoshita. itc 1994: 624-630
The following publications are possibly variants of this publication: