Diagnosis of Transistor Shorts in Logic Test Environment - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Sin-ya Kobayashi, Yuzo Takamatsu. Diagnosis of Transistor Shorts in Logic Test Environment. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 354-359, IEEE, 2006. [doi]

This author has not been identified. Look up 'Yoshinobu Higami' in GoogleThis author has not been identified. Look up 'Kewal K. Saluja' in GoogleThis author has not been identified. Look up 'Hiroshi Takahashi' in GoogleThis author has not been identified. Look up 'Sin-ya Kobayashi' in GoogleThis author has not been identified. Look up 'Yuzo Takamatsu' in Google

runs on WebDSL