Diagnosis of Transistor Shorts in Logic Test Environment - researchr publication

researchr

You are not signed in
Sign in
Sign up

Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Sin-ya Kobayashi, Yuzo Takamatsu. Diagnosis of Transistor Shorts in Logic Test Environment. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 354-359, IEEE, 2006. [doi]

Abstract is missing.

runs on WebDSL