Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahashi, Sin-ya Kobayashi, Yuzo Takamatsu. Diagnosis of Transistor Shorts in Logic Test Environment. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 354-359, IEEE, 2006. [doi]
@inproceedings{HigamiSTKT06-0,
title = {Diagnosis of Transistor Shorts in Logic Test Environment},
author = {Yoshinobu Higami and Kewal K. Saluja and Hiroshi Takahashi and Sin-ya Kobayashi and Yuzo Takamatsu},
year = {2006},
doi = {10.1109/ATS.2006.260955},
url = {https://doi.org/10.1109/ATS.2006.260955},
researchr = {https://researchr.org/publication/HigamiSTKT06-0},
cites = {0},
citedby = {0},
pages = {354-359},
booktitle = {15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006},
publisher = {IEEE},
isbn = {0-7695-2628-4},
}