A. Hirler, A. Alsioufy, J. Biba, T. Lehndorff, D. Lipp, H. Lochner, M. Siddabathula, S. Simon, T. Sulima, M. Wiatr, Walter Hansch. Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]
@inproceedings{HirlerABLLLSSSW19,
title = {Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability},
author = {A. Hirler and A. Alsioufy and J. Biba and T. Lehndorff and D. Lipp and H. Lochner and M. Siddabathula and S. Simon and T. Sulima and M. Wiatr and Walter Hansch},
year = {2019},
doi = {10.1109/IRPS.2019.8720536},
url = {https://doi.org/10.1109/IRPS.2019.8720536},
researchr = {https://researchr.org/publication/HirlerABLLLSSSW19},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019},
publisher = {IEEE},
isbn = {978-1-5386-9504-3},
}