S. Simon - researchr alias

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Viewing Publication 1 - 13 from 13

2022

Mission Profile Clustering Using a Universal Quantile CriterionA. Hirler, U. Abelein, M. Büttner, Ricarda Fischbach, Göran Jerke, Andreas Krinke, S. Simon. irps 2022: 1-9 [doi]

2019

Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor ReliabilityA. Hirler, A. Alsioufy, J. Biba, T. Lehndorff, D. Lipp, H. Lochner, M. Siddabathula, S. Simon, T. Sulima, M. Wiatr, Walter Hansch. irps 2019: 1-4 [doi]

2018

A spatial moments sub-pixel edge detector with edge blur compensation for imaging metrologyD. Gester, S. Simon. i2mtc 2018: 1-6 [doi]

2013

Stream Processing of Scientific Big Data on Heterogeneous Platforms - Image Analytics on Big Data in MotionS. M. Najmabadi, Michael Klaiber, Z. Wang, Yousef Baroud, S. Simon. cse 2013: 965-970 [doi]

2012

Promoting argumentation in primary science contexts: an analysis of students' interactions in formal and informal learning environmentsS. Simon, S. Johnson, S. Cavell, T. Parsons. jcal, 28(5):440-453, 2012. [doi]

Fast lossless image compression with 2D Golomb parameter adaptation based on JPEG-LSZ. Wang, Michael Klaiber, Yurij Gera, S. Simon, Thomas Richter. eusipco 2012: 1920-1924 [doi]

2011

In Situ Power Analysis of General Purpose Graphical Processing UnitsM. Z. Shaikh, M. Gregoire, W. Li, M. Wroblewski, S. Simon. pdp 2011: 40-44 [doi]

2009

Analysis of research into the teaching and learning of programmingJudy Sheard, S. Simon, Margaret Hamilton, Jan Lönnberg. icer 2009: 93-104 [doi]

2008

Computer-aided analysis of flow-characteristics of a micro-positioning systemBerend Denkena, S. Simon. peng, 2(2):185-191, 2008. [doi]

2003

Implementing a Management-Directed Information SystemDavid Paper, Ray Chang, S. Simon, Wai Yin Mok. amcis 2003: 223 [doi]

1997

Computer Supported Communication and Cooperation-Building Social Environments into Computer SystemsHolger Luczak, Johannes Springer, S. Simon. hci 1997: 277-280

1989

The use of gray-level information and fitting techniques for precise measurement of corneal curvature and thicknessA. Hachicha, S. Simon, J. Samson, K. Hanna. cvgip, 47(2):131-164, 1989. [doi]

1988

Model-based prediction-verification scheme for real-time inspectionS. Simon, J. P. Rogala. prl, 7(5):305-311, 1988. [doi]

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