Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability - researchr publication related

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A. Hirler, A. Alsioufy, J. Biba, T. Lehndorff, D. Lipp, H. Lochner, M. Siddabathula, S. Simon, T. Sulima, M. Wiatr, Walter Hansch. Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-4, IEEE, 2019. [doi]

The following publications are possibly variants of this publication:

Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliabilityA. Hirler, J. Biba, A. Alsioufy, T. Lehndorff, T. Sulima, H. Lochner, U. Abelein, Walter Hansch. mr, 76:38-41, 2017. [doi]

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