QED: Quick Error Detection tests for effective post-silicon validation - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra. QED: Quick Error Detection tests for effective post-silicon validation. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 154-163, IEEE, 2010. [doi]

This author has not been identified. Look up 'Ted Hong' in GoogleThis author has not been identified. Look up 'Yanjing Li' in GoogleThis author has not been identified. Look up 'Sung-Boem Park' in GoogleThis author has not been identified. Look up 'Diana Mui' in GoogleThis author has not been identified. Look up 'David Lin' in GoogleThis author has not been identified. Look up 'Ziyad Abdel Kaleq' in GoogleThis author has not been identified. Look up 'Nagib Hakim' in GoogleThis author has not been identified. Look up 'Helia Naeimi' in GoogleThis author has not been identified. Look up 'Donald S. Gardner' in GoogleThis author has not been identified. Look up 'Subhasish Mitra' in Google

runs on WebDSL