Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra. QED: Quick Error Detection tests for effective post-silicon validation. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 154-163, IEEE, 2010. [doi]
@inproceedings{HongLPMLKHNGM10,
title = {QED: Quick Error Detection tests for effective post-silicon validation},
author = {Ted Hong and Yanjing Li and Sung-Boem Park and Diana Mui and David Lin and Ziyad Abdel Kaleq and Nagib Hakim and Helia Naeimi and Donald S. Gardner and Subhasish Mitra},
year = {2010},
doi = {10.1109/TEST.2010.5699215},
url = {http://dx.doi.org/10.1109/TEST.2010.5699215},
researchr = {https://researchr.org/publication/HongLPMLKHNGM10},
cites = {0},
citedby = {0},
pages = {154-163},
booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010},
editor = {Ron Press and Erik H. Volkerink},
publisher = {IEEE},
isbn = {978-1-4244-7206-2},
}