The following publications are possibly variants of this publication:
- Overcoming post-silicon validation challenges through quick error detection (QED)David Lin, Ted Hong, Yanjing Li, Farzan Fallah, Donald S. Gardner, Nagib Hakim, Subhasish Mitra. date 2013: 320-325 [doi]
- E-QED: Electrical Bug Localization During Post-silicon Validation Enabled by Quick Error Detection and Formal MethodsEshan Singh, Clark W. Barrett, Subhasish Mitra. cav 2017: 104-125 [doi]
- Quick error detection tests with fast runtimes for effective post-silicon validation and debugDavid Lin, Eswaran S, Sharad Kumar, Eric Rentschler, Subhasish Mitra. date 2015: 1168-1173 [doi]
- Effective Post-Silicon Validation of System-on-Chips Using Quick Error DetectionDavid Lin, Ted Hong, Yanjing Li, Eswaran S, Sharad Kumar, Farzan Fallah, Nagib Hakim, Donald S. Gardner, Subhasish Mitra. tcad, 33(10):1573-1590, 2014. [doi]
- Quick detection of difficult bugs for effective post-silicon validationDavid Lin, Ted Hong, Farzan Fallah, Nagib Hakim, Subhasish Mitra. dac 2012: 561-566 [doi]
- Hybrid quick error detection (H-QED): accelerator validation and debug using high-level synthesis principlesKeith A. Campbell, David Lin, Subhasish Mitra, Deming Chen. dac 2015: 53 [doi]
- Symbolic Quick Error Detection for Pre-Silicon and Post-Silicon Validation: Frequently Asked QuestionsEshan Singh, David Lin, Clark Barrett, Subhasish Mitra. dt, 33(6):55-62, 2016. [doi]
- A structured approach to post-silicon validation and debug using symbolic quick error detectionDavid Lin, Eshan Singh, Clark Barrett, Subhasish Mitra. itc 2015: 1-10 [doi]
- QED post-silicon validation and debug: Invited abstractDavid Lin, Subhasish Mitra. isicir 2014: 62 [doi]
- QED post-silicon validation and debug: Frequently asked questionsDavid Lin, Subhasish Mitra. aspdac 2014: 478-482 [doi]