Quick detection of difficult bugs for effective post-silicon validation

David Lin, Ted Hong, Farzan Fallah, Nagib Hakim, Subhasish Mitra. Quick detection of difficult bugs for effective post-silicon validation. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 561-566, ACM, 2012. [doi]

Abstract

Abstract is missing.