Tsuyoshi Horikawa, Hideaki Okayama, Yosuke Onawa, Daisuke Shimura, Jun Ushida, Akemi Shiina, Tadashi Murao, Hiroki Yaegashi. A Compact Monitoring Circuit to Accurately Extract Fabrication Deviation in Silicon Waveguides. In European Conference on Optical Communications, ECOC 2020, Virtual Event, Belgium, December 6-10, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.