Tsuyoshi Horikawa - researchr alias

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Viewing Publication 1 - 14 from 14

2020

A Compact Monitoring Circuit to Accurately Extract Fabrication Deviation in Silicon WaveguidesTsuyoshi Horikawa, Hideaki Okayama, Yosuke Onawa, Daisuke Shimura, Jun Ushida, Akemi Shiina, Tadashi Murao, Hiroki Yaegashi. ecoc 2020: 1-4 [doi]

2019

2018

Spectral variation analysis of integrated silicon photonics devices by using optical wafer probingTsuyoshi Horikawa, Tohru Mogami. icicdt 2018: 161-164 [doi]

2017

Resonant Wavelength Variation Modelling for Microring Resonators based on Fabrication Deviation AnalysisTsuyoshi Horikawa, Daisuke Shimura, Hiroyuki Takahashi, Jun Ushida, Yohei Sobu, Akemi Shiina, Masatoshi Tokushima, Seok-Hwan Jeong, Keizo Kinoshita, Tohru Mogami. ecoc 2017: 1-3 [doi]

High-performance silicon photonics platform for low-power photonic integrated circuitsTohru Mogami, Tsuyoshi Horikawa, Keizo Kinoshita. mixdes 2017: 17-18 [doi]

2014

Delayed interferometer based Si-wire WDM demultiplexers fabricated by phase controllable and productive 300-mm wafer-scale ArF-immersion lithography technologySeok-Hwan Jeong, Daisuke Shimura, Takasi Simoyama, Tsuyoshi Horikawa, Yu Tanaka, Ken Morito. ofc 2014: 1-3 [doi]

Demonstration of over 1000-channel hybrid integrated light source for ultra-high bandwidth interchip optical interconnectionTakanori Shimizu, Makoto Okano, Hiroyuki Takahashi, Nobuaki Hatori, Masashige Ishizaka, Tsuyoshi Yamamoto, Masahiko Mori, Tsuyoshi Horikawa, Yutaka Urino, Takahiro Nakamura, Yasuhiko Arakawa. ofc 2014: 1-3 [doi]

2013

2005

Carrier separation analysis for clarifying carrier conduction and degradation mechanisms in high-k stack gate dielectricsWataru Mizubayashi, Naoki Yasuda, Kenji Okada, Hiroyuki Ota, Hirokazu Hisamatsu, Kunihiko Iwamoto, Koji Tominaga, Katsuhiko Yamamoto, Tsuyoshi Horikawa, Toshihide Nabatame. mr, 45(7-8):1041-1050, 2005. [doi]

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