Toshinori Hosokawa, Toshihiro Hiraoka, Mitsuyasu Ohta, Michiaki Muraoka, Shigeo Kuninobu. A Partial Scan Design Method Based on n-Fold Line-up Structures. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 306, IEEE Computer Society, 1997. [doi]
Abstract is missing.