Chih-Sheng Hou, Jin-Fu Li. High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy. IEEE Trans. VLSI Syst., 23(9):1720-1728, 2015. [doi]
@article{HouL15-1,
title = {High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy},
author = {Chih-Sheng Hou and Jin-Fu Li},
year = {2015},
doi = {10.1109/TVLSI.2014.2354378},
url = {http://dx.doi.org/10.1109/TVLSI.2014.2354378},
researchr = {https://researchr.org/publication/HouL15-1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {23},
number = {9},
pages = {1720-1728},
}