High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy - researchr publication related

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Chih-Sheng Hou, Jin-Fu Li. High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy. IEEE Trans. VLSI Syst., 23(9):1720-1728, 2015. [doi]

The following publications are possibly variants of this publication:

A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmapTsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang. date 2006: 53-58 [doi]

A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level RedundancyYu-Jen Huang, Da-Ming Chang, Jin-Fu Li. dft 2006: 362-370 [doi]

A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D RedundancyJin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow. itc 2003: 393-402 [doi]

A built-in self-repair design for RAMs with 2-D redundancyJin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu. tvlsi, 13(6):742-745, 2005. [doi]

Towards adaptive character frequency-based exclusive signature matching scheme and its applications in distributed intrusion detectionYuxin Meng, Wenjuan Li, Lam-for Kwok. cn, 57(17):3630-3640, 2013. [doi]

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