High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy

Chih-Sheng Hou, Jin-Fu Li. High Repair-Efficiency BISR Scheme for RAMs by Reusing Bitmap for Bit Redundancy. IEEE Trans. VLSI Syst., 23(9):1720-1728, 2015. [doi]

Abstract

Abstract is missing.