External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing

Tianshu Hou, Ngai Wong, Quan Chen, Zhigang Ji, Hai-Bao Chen. Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing. IEEE Trans. on CAD of Integrated Circuits and Systems, 42(12):4959-4972, December 2023. [doi]

Authors

Tianshu Hou

This author has not been identified. Look up 'Tianshu Hou' in Google

Ngai Wong

This author has not been identified. Look up 'Ngai Wong' in Google

Quan Chen

This author has not been identified. Look up 'Quan Chen' in Google

Zhigang Ji

This author has not been identified. Look up 'Zhigang Ji' in Google

Hai-Bao Chen

This author has not been identified. Look up 'Hai-Bao Chen' in Google
runs on